Investigation of native-oxide growth on HF-treated Si(111) surfaces by measuring the surface-state distribution

✍ Scribed by H. Angermann; Th. Dittrich; H. Flietner

• Publisher: Springer
• Year: 1994
• Tongue: English
• Weight: 497 KB
• Volume: 59
• Category: Article
• ISSN: 1432-0630
• DOI: 10.1007/bf00332216