✦ LIBER ✦
Investigation of metallic interdiffusion in AlxGa1−xN/GaN/sapphire heterostructures used for microelectronic devices by SEM/EDX and SIMS depth profiling
✍ Scribed by H. Téllez; J. M. Vadillo; J. J. Laserna
- Book ID
- 105893024
- Publisher
- Springer
- Year
- 2010
- Tongue
- English
- Weight
- 479 KB
- Volume
- 397
- Category
- Article
- ISSN
- 1618-2650
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