✦ LIBER ✦
Investigation of metalization failures of glass sealed ceramic dual in line integrated circuits : David B. Willmott. 15th A. Proc. Reliab. Phys. IEEE, Nevada. p. 158 (1977)
- Publisher
- Elsevier Science
- Year
- 1978
- Tongue
- English
- Weight
- 125 KB
- Volume
- 17
- Category
- Article
- ISSN
- 0026-2714
No coin nor oath required. For personal study only.