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Investigation of leakage current behaviour of Schottky gates on InAlAs/InGaAs/InP HFET structures by a 1D model

✍ Scribed by P Ellrodt; W Brockerhoff; F.J Tegude


Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
618 KB
Volume
38
Category
Article
ISSN
0038-1101

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