✦ LIBER ✦
Investigation of interface roughness cross-correlation properties of optical thin films from total scattering losses
✍ Scribed by Yongqiang Pan; Zhensen Wu; Lingxia Hang
- Publisher
- Elsevier Science
- Year
- 2010
- Tongue
- English
- Weight
- 328 KB
- Volume
- 256
- Category
- Article
- ISSN
- 0169-4332
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