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Investigation of interface defects in nanocrystalline SnO2 by positron annihilation

✍ Scribed by C.H. Shek; J.K.L. Lai; G.M. Lin


Book ID
108357689
Publisher
Elsevier Science
Year
1999
Tongue
English
Weight
139 KB
Volume
60
Category
Article
ISSN
0022-3697

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