Investigation of Indium Phosphide Nanocr
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Jinyoung Baek; Dr. Peter M. Allen; Prof. Moungi G. Bawendi; Prof. Klavs F. Jense
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Article
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2010
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John Wiley and Sons
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English
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Supporting information for this article is available on the WWW under http://dx.doi.org/10.1002/anie.201006412. 8452 diode-array spectrometer. TEM images were taken with JEOL 2010 high-resolution transmission electron microscope, and XRD data were obtained with Rigaku H3R.