Investigation of gate oxide breakdown in CMOS integrated circuits : B. Pesic, S. Dimitrijev and N. Stojadinovic. Microelectron. J.20(6), 19 (1989)

• Publisher: Elsevier Science
• Year: 1990
• Tongue: English
• Weight: 134 KB
• Volume: 30
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(90)90586-c