✦ LIBER ✦
Investigation of Electrostatic Integrity of Nanoscale Dual Material Gate Dielectric Pocket Silicon-on-Void (DMGDPSOV) MOSFET for Improved Device Scalability
✍ Scribed by Kumari, Vandana; Saxena, Manoj; Gupta, R. S.; Gupta, Mridula
- Book ID
- 121724284
- Publisher
- IEEE
- Year
- 2014
- Tongue
- English
- Weight
- 430 KB
- Volume
- 13
- Category
- Article
- ISSN
- 1536-125X
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