Investigation of Electronic Transport in Lateral NiFe/AlO/p-Si/AlO/NiFe Junctions

✍ Scribed by Lee, Y.C.; Lin, C.W.; Lee, H.M.; Horng, L.; Wu, J.C.

• Book ID: 114654772
• Publisher: IEEE
• Year: 2011
• Tongue: English
• Weight: 520 KB
• Volume: 47
• Category: Article
• ISSN: 0018-9464
• DOI: 10.1109/tmag.2011.2153192