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Investigation of electronic structure of impurity and defect centers on the surface of silica by the MNDO method

โœ Scribed by Yu. I. Gorlov; V. A. Zaets; A. A. Chuiko


Book ID
112367561
Publisher
Springer
Year
1989
Tongue
English
Weight
930 KB
Volume
24
Category
Article
ISSN
0040-5760

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