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Investigation of electron trapping behavior in n-channel organic thin-film transistors with ultrathin polymer passivation on SiO2 gate insulator

✍ Scribed by Shinji Tanida; Kei Noda; Hiroshi Kawabata; Kazumi Matsushige


Book ID
116899077
Publisher
Elsevier Science
Year
2010
Tongue
English
Weight
251 KB
Volume
160
Category
Article
ISSN
0379-6779

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