Investigation of Electrical Double Layers on SIO2 Surfaces by Means of Forcevs. Distance Measurements
✍ Scribed by H�ttl, Grit; Beyer, Dirk; M�ller, Eberhard
- Publisher
- John Wiley and Sons
- Year
- 1997
- Tongue
- English
- Weight
- 269 KB
- Volume
- 25
- Category
- Article
- ISSN
- 0142-2421
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✦ Synopsis
The formation of electrical charges at solid/liquid interfaces results in a di †use electrical double layer close to the solid surface. This layer determines, for example, the behaviour of ceramic particles in aqueous media and the e †ective pore radius of membranes acting in liquids. The system is used to demonstrate that linear SiO 2 /SiO 2 measurements using atomic force microscopy are suited for characterizing double layers at real surfaces. It has to be taken into consideration that the tip itself, which is acting as the probe, is also surrounded by a double layer and responds to the composition of the electrolyte in a material-speciÐc way. For this reason an oxidized silicon tip was used for the present investigations, so that tip and sample consisted the same material. In this way it is possible to obtain results that can be evaluated easily and compared with the DLVO theory.
1997 by John Wiley & Sons, ( Ltd.