Investigation of drain current RTS noise in small area silicon MOS transistors

✍ Scribed by O. Roux; B. Dierickx; E. Simoen; C. Claeys; G. Ghibaudo; J. Brini

• Publisher: Elsevier Science
• Year: 1991
• Tongue: English
• Weight: 171 KB
• Volume: 15
• Category: Article
• ISSN: 0167-9317
• DOI: 10.1016/0167-9317(91)90281-h