✦ LIBER ✦
Investigation of defects in SiO2 layer by determining the activation energy of charge carrier diffusion : J. Zak, D. Lis and S. Maczynski. Electron Technology, Vol. 4, No. 3 (1972), p. 29
- Publisher
- Elsevier Science
- Year
- 1972
- Tongue
- English
- Weight
- 109 KB
- Volume
- 11
- Category
- Article
- ISSN
- 0026-2714
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