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Investigation of Deep Submicron Single and Double Gate SOI MOSFETs in Accumulation Mode for Enhanced Performance

✍ Scribed by Rauly, E.; Iñiguez, B.; Flandre, D.


Book ID
121705850
Publisher
The Electrochemical Society
Year
2001
Tongue
English
Weight
235 KB
Volume
4
Category
Article
ISSN
1099-0062

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