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Investigation of deep states in thin films of hydrogenated amorphous silicon by photo-induced current transient spectroscopy

✍ Scribed by J. Herion; M. Tapiero; J. P. Zielinger; N. Benjelloun-Saki; W. Beyer

Book ID: 112376621
Publisher: Springer
Year: 1989
Tongue: English
Weight: 356 KB
Volume: 333
Category: Article
ISSN: 1618-2650
DOI: 10.1007/bf00572371

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