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Investigation of conduction mechanism in thick film resistors trimmed by the pulse voltage method : Toshio Tobita et al. IEEE Transactions on Components, Hybrids, and Manufacturing Technology, 15(4), 583 (1992)


Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
97 KB
Volume
33
Category
Article
ISSN
0026-2714

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