Investigation of body-tie effects on ion beam induced charge collection in silicon-on-insulator FETs using the Sandia nuclear microprobe

✍ Scribed by David S. Walsh; P.E. Dodd; M.R. Shaneyfelt; J.R. Schwank

• Book ID: 114164792
• Publisher: Elsevier Science
• Year: 2001
• Tongue: English
• Weight: 290 KB
• Volume: 181
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/s0168-583x(01)00486-4