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Investigation of BiFe0.95Mn0.03Zn0.02O3/Bi3.15Nd0.85Ti2.9Zr0.1O12 heterostructure thin film fabricated by a chemical solution deposition technique

✍ Scribed by Changchun Chen; LuRong Wang; ChunHua Lu; ZhongZi Xu

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Effects of film thickness on microstruct

✍ M. Liao; X.L. Zhong; Y. Qiao; J.B. Wang; Y.C. Zhou; H. Liao 📂 Article 📅 2009 🏛 Elsevier Science 🌐 English ⚖ 1002 KB

Electrical properties of Bi3.15Nd0.85Ti2

✍ ChangChun Chen; LuRong Wang; ZhongHai Tang; ChunHua Lu 📂 Article 📅 2011 🏛 Elsevier Science 🌐 English ⚖ 943 KB

Effects of TiO2 Seeding Layer on Crystal

✍ Jia Li; Jun Yu; Gang Peng; Yunbo Wang; Wenli Zhou 📂 Article 📅 2007 🏛 John Wiley and Sons 🌐 English ⚖ 365 KB

Structural evolution during crystallizat

✍ Takeshi Kobayashi; Ryo Ogawa; Makoto Kuwabara 📂 Article 📅 2003 🏛 Elsevier Science 🌐 English ⚖ 340 KB

Characterization of high quality chalcog

✍ E. Güneri, A. Kariper 📂 Article 📅 2013 🏛 The Korean Institute of Metals and Materials 🌐 English ⚖ 439 KB

Preparation of conductive LaNiO 3 film e

✍ Bao, Dinghua; Yao, Xi; Wakiya, Naoki; Shinozaki, Kazuo; Mizutani, Nobuyasu 📂 Article 📅 2003 🏛 Institute of Physics 🌐 English ⚖ 866 KB