Investigation of Back-Bias Capacitance Coupling Coefficient Measurement Methodology for Floating-Gate Nonvolatile Memory Cells

✍ Scribed by Beug, M.F.; Rafhay, Q.; van Duuren, M.J.; Duane, R.

• Book ID: 114619969
• Publisher: IEEE
• Year: 2010
• Tongue: English
• Weight: 317 KB
• Volume: 57
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2010.2045669