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Investigation of artefact sources in synchrotron microtomography via virtual X-ray imaging

✍ Scribed by F.P. Vidal; J.M. Létang; G. Peix; P. Cloetens

Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
749 KB
Volume
234
Category
Article
ISSN
0168-583X

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