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Investigation of Ar ion implant gettering of gold in silicon by m.o.s. and Rutherford backscattering techniques: A. G. Nassibian and B. Golija. IEE Proc., 127, (I, 1) 29 (February 1980)


Publisher
Elsevier Science
Year
1980
Tongue
English
Weight
45 KB
Volume
20
Category
Article
ISSN
0026-2714

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