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Investigation of alignment properties of Langmuir-Blodgett monolayers by scanning tunneling microscopy

✍ Scribed by J.Y. Fang; Z.H. Lu; L. Wang; Y. Wei

Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
375 KB
Volume
166
Category
Article
ISSN
0375-9601

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In this paper we present results concerning the development of a lithographic technique suitable for application to Langmuir-Blodgett films. Controlled ablations of well-defined portions of the film have been made by using a scanning force microscope (SFM). We report the values of the microscope ope