The origin of contrast in atomic force microscopy (AFM) lies in the probe's response to forces between itself and the sample. These forces most commonly result from changes in height as the tip is scanned over the surface, but can also originate in properties inherent in the sample. These have been
β¦ LIBER β¦
Investigation of aging effects in human hair using atomic force microscopy
β Scribed by Ki Heon Jeong; Kyung Sook Kim; Gi Ja Lee; Sam Jin Choi; Taek Jo Jeong; Min-Kyung Shin; Hun Kuk Park; Woo Young Sim; Mu-Hyoung Lee
- Book ID
- 111267942
- Publisher
- John Wiley and Sons
- Year
- 2011
- Tongue
- English
- Weight
- 269 KB
- Volume
- 17
- Category
- Article
- ISSN
- 0909-752X
No coin nor oath required. For personal study only.
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