Investigation by AES and EELS of ZnOInP (100) and SnO2Ag

✍ Scribed by M Bouslama; M Ghamnia; C Jardin; M Bouderbala; B Gruzza

• Publisher: Elsevier Science
• Year: 1996
• Tongue: English
• Weight: 499 KB
• Volume: 47
• Category: Article
• ISSN: 0042-207X
• DOI: 10.1016/s0042-207x(96)00176-5

✦ Synopsis

In this article, we study the thin films ZnO and SnO, of 5OOA, grown by cathodic RF sputtering on the substrates lnP(700) and Ag, respectively, by using auger electron spectroscopy (AES) and electron energy loss spectroscopy (EELS). The oxide ZnO/lnP f 100) is very stable against the heating in UHV and does not seem to be subjected to a charge effect in AES.

The auger spectrum 0-KLL of SnO, is compared with the ZnO one. The spectroscopy (EELS) displays that both oxides have similar behaviours from the view-point of energy loss by plasmons.