Investigating the CDM susceptibility of IC’s at package and wafer level by capacitive coupled TLP

✍ Scribed by Heinrich Wolf; Horst Gieser; Dirk Walter

• Book ID: 108210843
• Publisher: Elsevier Science
• Year: 2009
• Tongue: English
• Weight: 949 KB
• Volume: 49
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/j.microrel.2009.10.006