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Investigating stacking faults in nonpolar gallium nitride films using X-ray diffraction

✍ Scribed by M.A. Moram; C.F. Johnston; M.J. Kappers; C.J. Humphreys


Publisher
Elsevier Science
Year
2009
Tongue
English
Weight
187 KB
Volume
404
Category
Article
ISSN
0921-4526

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