Investigating Internal Gettering of Iron at Grain Boundaries in Multicrystalline Silicon via Photoluminescence Imaging

✍ Scribed by Liu, AnYao; Walter, Daniel; Phang, Sieu Pheng; Macdonald, Daniel

• Book ID: 121761253
• Publisher: Institute of Electrical and Electronics Engineers
• Year: 2012
• Tongue: English
• Weight: 513 KB
• Volume: 2
• Category: Article
• ISSN: 2156-3381
• DOI: 10.1109/JPHOTOV.2012.2195550