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Investigating chemical structure in a silicon CCD using extended X-Ray absorption fine structure

✍ Scribed by A. Keay; A. Wells; A. Owens; K.J. McCarthy

Book ID: 114169139
Publisher: Elsevier Science
Year: 1997
Tongue: English
Weight: 731 KB
Volume: 124
Category: Article
ISSN: 0168-583X
DOI: 10.1016/s0168-583x(97)00115-8

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