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Inversion charge modeling of SiGe PMOS and approaches to increasing the hole density in the SiGe channel

✍ Scribed by G.F. Niu; G. Ruan; T.A. Tang


Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
509 KB
Volume
38
Category
Article
ISSN
0038-1101

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