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Inverse-narrow-width effects and small-geometry MOSFET threshold voltage model

โœ Scribed by Hsueh, K.K.-L.; Sanchez, J.L.; Demassa, T.A.; Akers, L.A.


Book ID
114535418
Publisher
IEEE
Year
1988
Tongue
English
Weight
996 KB
Volume
35
Category
Article
ISSN
0018-9383

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