Introduction to Analytical Electron Microscopy

✍ Scribed by J. M. Cowley (auth.), John J. Hren, Joseph I. Goldstein, David C. Joy (eds.)

• Publisher: Springer US
• Year: 1979
• Tongue: English
• Leaves: 609
• Edition: 1
• Category: Library

✦ Synopsis

The birth of analytical electron microscopy (AEM) is somewhat obscure. Was it the recognition of the power and the development of STEM that signaled its birth? Was AEM born with the attachment of a crystal spectrometer to an otherwise conventional TEM? Or was it born earlier with the first analysis of electron loss spectra? It's not likely that any of these developments alone would have been sufficient and there have been many others (microdiffraction, EDS, microbeam fabrication, etc.) that could equally lay claim to being critical to the establishment of true AEM. It is probably more accurate to simply ascribe the present rapid development to the obvious: a combination of ideas whose time has come. Perhaps it is difficult to trace the birth of AEM simply because it remains a point of contention to even define its true scope. For example, the topics in this book, even though very broad, are still far from a complete description of what many call AEM. When electron beams interact with a solid it is well-known that a bewildering number of possible interactions follow. Analytical electron microscopy attempts to take full qualitative and quantitative advantage of as many of these interactions as possible while still preserving the capability of high resolution imaging. Although we restrict ourselves here to electron transparent films, much of what is described applies to thick specimens as well. Not surprisingly, signals from all possible interactions cannot yet (and probably never will) be attained simultaneously under optimum conditions.

✦ Table of Contents

Front Matter....Pages i-xv
Principles of Image Formation....Pages 1-42
Introductory Electron Optics....Pages 43-82
Principles of Thin Film X-Ray Microanalysis....Pages 83-120
Quantitative X-Ray Microanalysis: Instrumental Considerations and Applications to Materials Science....Pages 121-167
EDS Quantitation and Application to Biology....Pages 169-197
Monte Carlo Simulation in Analytical Electron Microscopy....Pages 199-221
The Basic Principles of Electron Energy Loss Spectroscopy....Pages 223-244
Energy Loss Spectrometry for Biological Research....Pages 245-258
Elemental Analysis Using Inner-Shell Excitations: A Microanalytical Technique for Materials Characterization....Pages 259-294
Analysis of the Electronic Structure of Solids....Pages 295-304
Stem Imaging of Crystals and Defects....Pages 305-332
Biological Scanning Transmission Electron Microscopy....Pages 333-342
Electron Microscopy of Individual Atoms....Pages 343-368
Microdiffraction....Pages 369-385
Convergent Beam Electron Diffraction....Pages 387-422
Radiation Damage with Biological Specimens and Organic Materials....Pages 423-436
Radiation Effects in Analysis of Inorganic Specimens by TEM....Pages 437-480
Barriers to AEM: Contamination and Etching....Pages 481-505
Microanalysis by Lattice Imaging....Pages 507-534
Weak-Beam Microscopy....Pages 535-549
The Analysis of Defects Using Computer Simulated Images....Pages 551-574
The Strategy of Analysis....Pages 575-593
Back Matter....Pages 595-601

✦ Subjects

Characterization and Evaluation of Materials