Introducing dependency into IC yield models : Virginia Foard Flack. Solid-St. Electron.28 (6) 555 (1985)

• Book ID: 103279960
• Publisher: Elsevier Science
• Year: 1986
• Tongue: English
• Weight: 129 KB
• Volume: 26
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(86)90042-9