✦ LIBER ✦
Intrinsic stress development and microstructure evolution of Au/Cr/Si multilayer thin films subject to annealing
✍ Scribed by David C. Miller; Cari F. Herrmann; Hans J. Maier; Steve M. George; Conrad R. Stoldt; Ken Gall
- Book ID
- 113895377
- Publisher
- Elsevier Science
- Year
- 2005
- Tongue
- English
- Weight
- 444 KB
- Volume
- 52
- Category
- Article
- ISSN
- 1359-6462
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