✦ LIBER ✦
Intrinsic parameter fluctuations in decananometer MOSFETs introduced by gate line edge roughness
✍ Scribed by Asenov, A.; Kaya, S.; Brown, A.R.
- Book ID
- 114617119
- Publisher
- IEEE
- Year
- 2003
- Tongue
- English
- Weight
- 585 KB
- Volume
- 50
- Category
- Article
- ISSN
- 0018-9383
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