✦ LIBER ✦
Intrinsic mobility and its surface degradation parameters in narrow channel width PMOS devices at cryogenic temperatures
✍ Scribed by M.J. Deen; J. Wang; R.H.S. Hardy
- Book ID
- 103388829
- Publisher
- Elsevier Science
- Year
- 1989
- Tongue
- English
- Weight
- 318 KB
- Volume
- 32
- Category
- Article
- ISSN
- 0038-1101
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