Intrinsic Data Retention in Nanoscaled Phase-Change Memories—Part II: Statistical Analysis and Prediction of Failure Time

✍ Scribed by Andrea Redaelli; Daniele Ielmini; Ugo Russo; Andrea L. Lacaita

• Book ID: 114618507
• Publisher: IEEE
• Year: 2006
• Tongue: English
• Weight: 257 KB
• Volume: 53
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2006.885525