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Intraoperative retinal light damage reflected in electrophysiologic data

✍ Scribed by Manfred Lessel; Arnulf Thaler; Peter Heilig; Wolfgang Jantsch; Viktor Scheiber

Publisher
Springer-Verlag
Year
1991
Tongue
English
Weight
399 KB
Volume
76
Category
Article
ISSN
0012-4486

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✦ Synopsis

In a series of 30 unilaterally pseudophakic patients, electroretinograms and electrooculograms were recorded 6 months postoperatively. The unoperated on fellow eyes served as controls. High intraoperative retinal light exposure (3.4-7.3 mW/cm 2, Zeiss OPMI 6 operating microscope) caused a substantial reduction of electrophysiologic potentials. Light protection prevented deterioration of electroretinogram and electro-oculogram potentials; reducing the bulb voltage, tilting the axis of illumination, filtering short wavelengths and the use of light shields resulted in 4-log-unit lower intensities (0.8-3.7/~W/cm2).

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