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Interpretation of profiles obtained by C(V) technique in presence of deep traps: Application to proton irradiated GaAs samples

✍ Scribed by S. Loualiche; A. Nouailhat; G. Guillot


Publisher
Elsevier Science
Year
1982
Tongue
English
Weight
496 KB
Volume
25
Category
Article
ISSN
0038-1101

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