Interphase characterization via the stiffness contrast of a scanning force microscope in displacement modulation mode

✍ Scribed by M. Munz; H. Sturm; E. Schulz

• Publisher: John Wiley and Sons
• Year: 2000
• Tongue: English
• Weight: 295 KB
• Volume: 30
• Category: Article
• ISSN: 0142-2421
• DOI: 10.1002/1096-9918(200008)30:1<410::aid-sia846>3.0.co;2-g