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Internal thermal resistance of a multi-chip packaging design for VLSI-based systems : Y. C. Lee, H. T. Ghaffari and John M. Segelken. IEEE Trans. Compon. Hybrids. mfg Technol.12(2), 163 (1989)


Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
136 KB
Volume
30
Category
Article
ISSN
0026-2714

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