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Internal stress measurements by high-energy synchrotron X-ray diffraction at increased specimen-detector distance

✍ Scribed by J Böhm; A Wanner; R Kampmann; H Franz; K.-D Liss; A Schreyer; H Clemens


Book ID
114166401
Publisher
Elsevier Science
Year
2003
Tongue
English
Weight
272 KB
Volume
200
Category
Article
ISSN
0168-583X

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