𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Internal reflection mode scanning near-field optical microscopy with the tetrahedral tip on metallic samples

✍ Scribed by J. Ferber; U.C. Fischer; N. Hagedorn; H. Fuchs


Publisher
Springer
Year
1999
Tongue
English
Weight
577 KB
Volume
69
Category
Article
ISSN
1432-0630

No coin nor oath required. For personal study only.