✦ LIBER ✦
Internal friction: a fast technique for electromigration failure analysis : F. Volkommer, H. G. Bohn, K.-H. Robrock and W. Schillng. 28th A. Proc. Reliab. Phys. Symp. (IEEE), 51 (March 1990)
- Publisher
- Elsevier Science
- Year
- 1991
- Tongue
- English
- Weight
- 131 KB
- Volume
- 31
- Category
- Article
- ISSN
- 0026-2714
No coin nor oath required. For personal study only.