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Intermediate valence in YbAl3 and EuCu2Si2 by X-ray Photoemission (XPS)

✍ Scribed by K.H.J. Buschow; M. Campagna; G.K. Wertheim

Publisher
Elsevier Science
Year
1977
Tongue
English
Weight
382 KB
Volume
24
Category
Article
ISSN
0038-1098

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