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Interlayer methods for reducing the dislocation density in gallium nitride

โœ Scribed by M.J. Kappers; M.A. Moram; Y. Zhang; M.E. Vickers; Z.H. Barber; C.J. Humphreys


Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
835 KB
Volume
401-402
Category
Article
ISSN
0921-4526

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The gallium nitride (GaN) presents very good mechanical, chemical and physical properties, as high velocities. These properties make it more attractive for high power, temperature and frequency electronic applications. In this paper, the main electrical properties of GaN are first presented; then it