Interferometric techniques for correction of sample tilt in the Sommargren profilometer for surface roughness studies: R. P. Shukla, G. M. Perera, P. Venkateswarlu, M. C. George, Optics and Laser Technology, 23(2), pp. 98–104. (Apr 1991)

• Book ID: 107889129
• Publisher: Elsevier Science
• Year: 1992
• Tongue: English
• Weight: 274 KB
• Volume: 14
• Category: Article
• ISSN: 0141-6359
• DOI: 10.1016/0141-6359(92)90188-3