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Interferometric techniques for correction of sample tilt in the Sommargren profilometer for surface roughness studies

✍ Scribed by R.P. Shukla; G.M. Perera; P. Venkateswarlu; M.C. George


Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
738 KB
Volume
23
Category
Article
ISSN
0030-3992

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