Interferometric measurement of electron-hole pair recombination lifetime as a function of the injection level

✍ Scribed by G. Breglio; A. Cutolo; P. Spirito; L. Zeni

• Book ID: 126752003
• Publisher: IEEE
• Year: 1993
• Tongue: English
• Weight: 311 KB
• Volume: 14
• Category: Article
• ISSN: 0741-3106
• DOI: 10.1109/55.244739